Language
ALL
  • ALL
  • 製程
  • 廠商
HIOKI FA1283 高密度飛針測試機

1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.

1 2
產品特色
  • Horizontal Double-Sided Flying Probe Tester 2 Upper Probes + 2 Lower Probes
  • Complete Electrical Testing of High-Function Boards with a Single Unit.
  • High-Speed Testing at up to 100 point/sec.
  • Significant expansion of the guaranteed range of low resistance and ultra-insulation testing.
  • Embedded Device Measurement: A Sharp Departure from LCR Measurement.
  • 1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.
產品資訊
  • 原廠名稱
    HIOKI
  • 製程名稱
    測試/檢查/品管篇
  • 英文名稱
    FA1283 Flying Probe Tester
  • 產品細目
    測試機
連絡窗口

若有任何需求,請與我們聯繫

  • 楊志鴻
    • Tel : 03-3529332 ext. 621
    • Mail : mason_yang@tkk.com.tw
  • 沈宗諭
    • Tel : 03-352-9332 # 633
    • Mail : jeff_shen@tkk.com.tw